Spectrometric and spectroscopic analysis
X-Ray photoelectron spectroscopy (XPS)
Available models:
Overview:
Xray photoelectron spectroscopy allows the analysis of surface composition. The Axis-Ultra and Escalab MKII models are multifunctional equipments coupling many characterization techniques: XPS, ISS and ASM (Axis-Ultra), XPS, SIMS, ISS and ASM (Escalab MKII).
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Auger spectroscopy
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Overview:
Equipement capable of semi-quantitative mapping of chemical composition (surface and profile). The JOEL model allows in-situ rupture of samples with liquid helium for the analysis of the ruptured surface without contamination.
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Fourier transform infrared spectroscopy (FT-IR)
Available models:
Overview:
FT-IR are used for the identification of organic and inorganic material and the determination of molecular structures. Examples of types of analyses: attenuated total reflectance (ATR, diamond and germanium), reflection adsorption spectroscopy (IRRAS), diffuse reflectance (DRIFTS), imaging FT-IR.
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Raman spectroscopy
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Overview:
Raman spectroscopy allows the analysis of molecular structure of organic and inorganic elements. The Invia model, unique in Quebec, is equipped with four lasers: 488 nm, 514 nm, 633 nm et 785 nm. The spectrometer permits confocal analysis, in-line focus imaging and depth profiling.
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Xray diffraction (XRD)
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Overview:
Diffractometers allow, among other analyses, the study of cristalline phases, stress measurement and epitaxial deposition quality.
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Nuclear magnetic resonance (NMR)
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Overview:
The Agilent-Varian Inova 600 is a hybride apparatus capable of studying both solids and liquids. It is equipped with two probes: the first, a double-resonance 4 mm probe (rotating speed up to 18 kHz); the second a triple resonance BioMass 3.2 mm probe (rotating speed up to 25 kHz).
The Agilent-Varian Inova 400 is used for solid samples analysis over an extended range of temperatures.
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UV-visible spectrophotometer
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Overview:
Thermo Scientific Evolution 300 spectrophotometer enables quantitative analysis on various matrix (water, flux,etc..). Wavelength range is from 190 to 1100 nm.
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3D Tomography X-Ray
Overview :
3D Tomography X-Ray is a non-destructive inspection technique which gives the ability to see critical internal metallic structure, features and defects thanks to a tridimensional image reconstitution. XCT-200 model resolution is under 0.6 microns.
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X-Ray microfluorescence (XRF)
Overview:
µXRF is a non-destructive technique which enables to determine the materials composition inside a sample.
Fisherscope X-RAY XDV-µ model also enables thickness measurement (with calibration standard).
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2D X-ray
Overview :
2D X-ray imaging is a non destructive inspection technique. FOX 160.25 model enables non destructive inspection of micro-electronic modules.
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Optical emission spectrometer with inductively-coupled plasma (ICP-OES)
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Overview :
ICP-OES device is used to quantitatively and semi-quantitatively analyse inorganic elements.
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