Scanning electron microscopy (SEM)
Scanning electron microscopy (SEM)
Available models:
Overview:
The JSM 7600 TFE from JEOL is an equipement unique in Canada permitting the observation of non-conducting samples with high resolution. Modes of analysis offered : backscatter detection for phase analysis, energy dispersive (EDS) and wavelength dispersive (WDS) Xray spectrometry for chemical analysis.
The model from Zeiss is multifonctional and allows the characterization by cathodoluminescence with a 100 nm lateral resolution for the characterization of qunatum dots and crystalline defects.
Use this equipment
